A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits
نویسندگان
چکیده
This paper describes an algorithm for the extraction of the critical area for opens. The presented algorithm allows for the analysis of industrial size ICs with non-Manhattan geometry. Illustrative examples of the proposed algorithm, implemented by using design rule checker operations, are presented. It is shown that the extraction of the critical area for realistic size VLSI circuits designs can be done in an acceptable time.
منابع مشابه
Extraction of critical areas for opens in large VLSI circuits
This paper describes a new algorithm for the extraction of the critical area for opens. The presented algorithm allows for the analysis of large IC’s and non-Manhattan geometry. Concept of the contact/via contacting regions is proposed and its relevance is discussed. Illustrative examples of the proposed algorithm are presented.
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ورودعنوان ژورنال:
- IEEE Trans. on CAD of Integrated Circuits and Systems
دوره 18 شماره
صفحات -
تاریخ انتشار 1999